BCTDS
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Related Articles from SNS
Probing the Dynamics of Two-Level System Defect Ensembles via Broadband Cryogenic Transient Dielectric Spectroscopy
arXiv:2505.18263v4 Announce Type: replace-cross Abstract: Two-level system (TLS) defects in dielectrics are a major source of decoherence in superconducting circuits, yet their microscopic origin and distribution remain poorly understood. Existing circuit-QED probes access limited frequency ranges and mode volumes, restricting studies of isolated materials and interfaces. Here, we present Broadband Cryogenic Transient Dielectric Spectroscopy (BCTDS), a technique for probing TLS-hosting...