Design-Technology Co-Optimization
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Accelerating NBTI Aging Evaluation via Physics-Aware Graph Attention Networks
Announce Type: new Abstract: As semiconductor technology advances to smaller nodes, Negative Bias Temperature Instability (NBTI) under prolonged workloads has emerged as a significant bottleneck constraining reliability-aware Design-Technology Co-Optimization (DTCO). Conventional TCAD simulations incur prohibitive computational overhead when evaluating device aging characteristics, making it difficult to satisfy the demand for efficient iterative design cycles. To address this challenge,...
DTCO of NOR-Type IGZO FeFETs for 3D Heterogeneous AI Memories: A Read-Centric Perspective
arXiv:2604.13624v2 Announce Type: replace Abstract: InGaZnO (IGZO)-channel FeFETs have attracted notable interest thanks to recent advances in endurance, opening up their application space for read-dominated AI memory tiers. This work evaluates the viability of NOR-type IGZO FeFETs for 3D heterogeneous AI memories from a read-centric design-technology co-optimization (DTCO) perspective, spanning on-chip back-end-of-line (BEOL) RAMs and hybrid-bonded memory chiplets, and off-chip,...