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Accelerating NBTI Aging Evaluation via Physics-Aware Graph Attention Networks

Announce Type: new Abstract: As semiconductor technology advances to smaller nodes, Negative Bias Temperature Instability (NBTI) under prolonged workloads has emerged as a significant bottleneck constraining reliability-aware Design-Technology Co-Optimization (DTCO). Conventional TCAD simulations incur prohibitive computational overhead when evaluating device aging characteristics, making it difficult to satisfy the demand for efficient iterative design cycles. To address this challenge,...

arXiv CS 9d ago