Silicon Photonics Testing: Design for Testability, Fault Detection
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Silicon Photonics Testing: Design for Testability, Fault Detection, and Manufacturing Variation Analysis in Photonic Integrated Circuits
Announce Type: new Abstract: This paper proposes a design-for-test (DFT) methodology and architecture for testing and validation of silicon photonic integrated circuits. We describe the design of silicon photonic circuits and components that comprise the proposed DFT architecture. The designs are extensively simulated and validated as test-access and fault-detection circuitry.
Silicon Photonics Testing: Design for Testability, Fault Detection, and Manufacturing Variation Analysis in Photonic Integrated Circuits
Announce Type: cross Abstract: This paper proposes a design-for-test (DFT) methodology and architecture for testing and validation of silicon photonic integrated circuits. We describe the design of silicon photonic circuits and components that comprise the proposed DFT architecture. The designs are extensively simulated and validated as test-access and fault-detection circuitry.