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Single ion maps 3D electromagnetic fields above chips with record sensitivity

Single ion maps 3D electromagnetic fields above chips with record sensitivity
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Researchers at ETH Zurich have developed a method that uses a single ion to detect electromagnetic fields above a surface and to create a three-dimensional map of them. In the future, this approach can be used to improve chips for quantum computers and quantum sensors.

Researchers at ETH Zurich have developed a method that uses a single ion to detect electromagnetic fields above a surface and to create a three-dimensional map of them. In the future, this approach can be used to improve chips for quantum computers and quantum sensors.
ETH Zurich (ORG)
Originally published by Phys.org Read original →