Latent Anchor-Driven Test Generation for
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Latent Anchor-Driven Test Generation for Deep Neural Networks
arXiv:2606.04310v1 Announce Type: new Abstract: Deep Neural Networks (DNNs) are increasingly being deployed in security-critical and safety-sensitive applications, which makes rigorous testing essential to identify and mitigate model weaknesses. Existing DNN testing approaches explore either the input space or a learned latent space.